EBSD (Electron Backscatter Diffraction)
Definition: EBSD (Electron Backscatter Diffraction) is a scanning electron microscopy analysis method for determining grain orientation, crystal structure and phase distribution in materials. Backscattered electrons are used to generate characteristic diffraction patterns. The method is applied integrated within the SEM.
Practical relevance: EBSD enables the quantitative analysis of textures, grain boundary character (e.g. Σ values), deformation states and phase transformations. The spatial resolution is in the submicrometre range. Applications are found in materials development, failure analysis and the assessment of additively manufactured components. A prerequisite is high-quality, stress-free sample preparation.
Decision-making perspectives:
- Technical decision-makers: Assessment of microstructural anisotropies and process effects on grain structure.
- Purchasing/project management: Specification of detailed microstructure analyses for quality-critical components.
- Science: Texture analysis, grain boundary statistics and validation of crystal plasticity models.
- Insurance/law: Microscopic verification of microstructural deviations in failure cases.
Typical testing or verification methods: EBSD mapping in the SEM, phase identification, grain boundary analysis, combination with EDX.
FAQ:
- What is EBSD used for?
- For the detailed analysis of grain orientation, texture and phases in metallic and ceramic materials.
