Scanning Electron Microscopy (SEM)
Definition: Scanning electron microscopy (SEM) is an imaging analysis method in which a surface is scanned in a raster pattern with a focused electron beam. Interactions between the electrons and the sample generate signals such as secondary electrons (SE) or backscattered electrons (BSE). The method enables high-resolution investigations down to the nanometre range.
Practical relevance: SEM is used for fractography, microstructure analysis, particle characterisation and coating assessment. In combination with EDX, spatially resolved elemental analysis is possible, and with EBSD, grain orientation analysis. Sample preparation, conductivity and coating significantly influence image quality and the analysis result.
Decision-making perspectives:
- Technical decision-makers: Identification of crack causes, inclusions or interface problems.
- Purchasing/project management: Commissioning of well-founded failure or material analyses.
- Science: Investigation of micro- and nanoscale structures and phase distributions.
- Insurance/law: Court-proof documentation of fracture surfaces and damage mechanisms.
Typical testing or verification methods: SE/BSE imaging, SEM-EDX analysis, EBSD mapping, fractography.
FAQ:
- What is the advantage of an SEM compared with a light microscope?
- The SEM offers significantly higher resolution and greater depth of field for detailed microstructure and fracture surface analyses.