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TEM (Transmission Electron Microscopy)

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Definition: Transmission electron microscopy (TEM) is a high-resolution analysis method in which an electron beam passes through an extremely thin specimen. Interactions generate imaging and diffraction information with atomic or nanometric resolution. The method allows the investigation of crystal structure and defects.

Practical relevance: TEM is used to analyse precipitates, dislocations, phase boundaries and nanostructures. Complementary techniques such as electron diffraction (SAED) or STEM-EDX enable detailed structural and chemical analyses. Specimen preparation (e.g. FIB lamellae) is demanding and requires great care.

Decision-making perspectives:

  • Technical decision-makers: Investigation of nanoscale defects or failure mechanisms in high-performance materials.
  • Purchasing/project management: Commissioning specialised analyses for complex development or failure questions.
  • Science: Analysis of atomic lattice structures, phase identification and defect characterisation.
  • Insurance/law: High-resolution verification of material defects in disputed damage cases.

Typical testing or verification methods: TEM imaging, SAED diffraction, STEM-EDX analysis, FIB specimen preparation.

FAQ:

  • What is the advantage of TEM compared to SEM?
  • TEM achieves significantly higher resolutions and enables the analysis of crystal structures at the atomic level.
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