Spectral analysis
Definition: Spectral analysis is an analytical method for determining the chemical composition of a material on the basis of characteristic emission or absorption spectra. It uses the element-specific spectral lines for qualitative and quantitative analysis. In materials engineering, it is used to determine alloying and trace elements.
Practical relevance: Typical methods are optical emission spectroscopy (OES), X-ray fluorescence analysis (XRF) or ICP-OES. Detection limits and accuracy depend on the method and the sample preparation. Applications include incoming goods inspections, PMI testing and failure analyses. Results are compared with normative material specifications.
Decision-making perspectives:
- Technical decision-makers: Ensuring the correct material composition in safety-relevant components.
- Purchasing/project management: Verification of supplier assurances in accordance with material standards.
- Science: Validation of analytical accuracy and comparison of different spectrometry methods.
- Insurance/law: Documented proof of material deviations in liability cases.
Typical testing or verification methods: OES, XRF, ICP-OES, comparison with reference materials.
FAQ:
- What is the difference between OES and XRF?
- OES uses emission lines after spark excitation, whereas XRF measures fluorescent X-rays without removing material.
