{"id":3143,"date":"2026-06-24T16:13:02","date_gmt":"2026-06-24T14:13:02","guid":{"rendered":"https:\/\/www.technical-center.de\/wiki\/fib-focused-ion-beam-2\/"},"modified":"2026-06-24T16:13:02","modified_gmt":"2026-06-24T14:13:02","slug":"fib-focused-ion-beam-2","status":"publish","type":"encyclopedia","link":"https:\/\/www.technical-center.de\/en\/glossary\/fib-focused-ion-beam-2\/","title":{"rendered":"FIB (Focused Ion Beam)"},"content":{"rendered":"<p><strong>Definition:<\/strong> FIB (Focused Ion Beam) is a microscopic technique in which a focused ion beam &#8211; usually gallium ions &#8211; is used for targeted material removal or deposition. It serves for high-precision sample preparation and microstructure investigation in the sub-micrometre to nanometre range. FIB is frequently combined with a scanning electron microscope (FIB-SEM).<\/p>\n<p><strong>Practical relevance:<\/strong> FIB enables the creation of local cross-sections, TEM lamellae or 3D tomographies through serial removal. Applications are found in <a class=\"tc-inlink\" href=\"\/en\/failure-analysis-forensic-engineering\/\">failure analysis<\/a>, semiconductor technology, coating evaluation and materials research. Beam current, accelerating voltage and the minimisation of ion implantation or beam damage are decisive factors.<\/p>\n<p><strong>Decision-making perspectives:<\/strong><\/p>\n<ul>\n<li><strong>Technical decision-makers:<\/strong> Investigation of local defects, interfaces and microcracks with high spatial resolution.<\/li>\n<li><strong>Purchasing\/project management:<\/strong> Commissioning of specialised analyses for complex failure or development questions.<\/li>\n<li><strong>Science:<\/strong> Preparation of TEM samples, 3D reconstructions and nanoscale microstructure analyses.<\/li>\n<li><strong>Insurance\/law:<\/strong> Microscopic preservation of evidence in materials-related disputes.<\/li>\n<\/ul>\n<p><strong>Typical testing or verification methods:<\/strong> FIB cross-section analysis, TEM lamella preparation, 3D FIB tomography, combination with EDX or EBSD.<\/p>\n<p><strong>FAQ:<\/strong><\/p>\n<ul>\n<li>What is a FIB system used for?<\/li>\n<li>For high-precision sample preparation, local microstructure analysis and investigation of nanoscale defects.<\/li>\n<\/ul>\n","protected":false},"author":0,"featured_media":0,"template":"","encyclopedia-tag":[],"class_list":["post-3143","encyclopedia","type-encyclopedia","status-publish","hentry"],"_links":{"self":[{"href":"https:\/\/www.technical-center.de\/en\/wp-json\/wp\/v2\/encyclopedia\/3143","targetHints":{"allow":["GET"]}}],"collection":[{"href":"https:\/\/www.technical-center.de\/en\/wp-json\/wp\/v2\/encyclopedia"}],"about":[{"href":"https:\/\/www.technical-center.de\/en\/wp-json\/wp\/v2\/types\/encyclopedia"}],"wp:attachment":[{"href":"https:\/\/www.technical-center.de\/en\/wp-json\/wp\/v2\/media?parent=3143"}],"wp:term":[{"taxonomy":"encyclopedia-tag","embeddable":true,"href":"https:\/\/www.technical-center.de\/en\/wp-json\/wp\/v2\/encyclopedia-tag?post=3143"}],"curies":[{"name":"wp","href":"https:\/\/api.w.org\/{rel}","templated":true}]}}